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Volumn 80, Issue 2, 2005, Pages 201-206
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Microstructure and ferroelectric properties of r.f. magnetron sputtering derived PZT thin films deposited on interlayer (PbO/TiO2)
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Author keywords
Ferroelectric properties; Ferroelectric random access memory; Interlayer; PZT thin film
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Indexed keywords
LEAD OXIDE;
LEAD TITANATE ZIRCONATE;
PLATINUM;
SILICON;
SILICON DIOXIDE;
TITANIUM;
TITANIUM DIOXIDE;
UNCLASSIFIED DRUG;
ZIRCONIUM DERIVATIVE;
CHEMISTRY;
CONFERENCE PAPER;
CRYSTALLIZATION;
ELECTRIC ACTIVITY;
ELECTRODE;
FILM;
HIGH TEMPERATURE;
MICROWAVE OVEN;
MICROWAVE RADIATION;
PROCESS DEVELOPMENT;
RADIOFREQUENCY RADIATION;
STRUCTURE ANALYSIS;
SURFACE PROPERTY;
TEMPERATURE DEPENDENCE;
X RAY PHOTOELECTRON SPECTROSCOPY;
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EID: 17144418897
PISSN: 0026265X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.microc.2004.07.012 Document Type: Conference Paper |
Times cited : (13)
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References (14)
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