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Volumn 80, Issue 2, 2005, Pages 201-206

Microstructure and ferroelectric properties of r.f. magnetron sputtering derived PZT thin films deposited on interlayer (PbO/TiO2)

Author keywords

Ferroelectric properties; Ferroelectric random access memory; Interlayer; PZT thin film

Indexed keywords

LEAD OXIDE; LEAD TITANATE ZIRCONATE; PLATINUM; SILICON; SILICON DIOXIDE; TITANIUM; TITANIUM DIOXIDE; UNCLASSIFIED DRUG; ZIRCONIUM DERIVATIVE;

EID: 17144418897     PISSN: 0026265X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microc.2004.07.012     Document Type: Conference Paper
Times cited : (13)

References (14)
  • 14
    • 0000503141 scopus 로고
    • Auger and X-ray Photoelectron Spectroscopy
    • 2nd ed. Wiley New York
    • D. Briggs M.P. Seah Auger and X-ray Photoelectron Spectroscopy 2nd ed. Practical Surface Analysis vol. 1 1990 Wiley New York 259
    • (1990) Practical Surface Analysis , vol.1 , pp. 259
    • Briggs, D.1    Seah, M.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.