Relationship between the C KVV Auger line shape and layered structure of graphite

Applied Surface Science

Volumn 245, Issue 1-4, 2005, Pages 128-134

  Dementjev, A P ^a   Maslakov, K I ^a   Naumkin, A V ^b  

^a KURCHATOV INSTITUTE   (Russian Federation)

^b A N NESMEYANOV INSTITUTE OF ORGANOELEMENT COMPOUNDS   (Russian Federation)

Author keywords

Auger spectroscopy; Graphite; Interlayer interaction; Surface sensitivity

Indexed keywords

ATOMS; AUGER ELECTRON SPECTROSCOPY; CARBON NANOTUBES; ELECTRONS; FULLERENES; SENSITIVITY ANALYSIS; SURFACE CHEMISTRY; X RAY PHOTOELECTRON SPECTROSCOPY;

AUGER SPECTROSCOPY; INTERLAYER INTERACTION; LAYERED STRUCTURES; SURFACE SENSITIVITY;

GRAPHITE;

EID: 17044431543     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.10.002     Document Type: Article

References (28)

1. D.E. Ramaker J. Vac. Sci. Technol. 47 1989 1614; D.E. Ramaker Crit. Rev. Solid State Mater. Sci. 17 1991 211.
2. D.E. Ramaker J. Vac. Sci. Technol. 47 1989 1614; D.E. Ramaker Crit. Rev. Solid State Mater. Sci. 17 1991 211.
3. J.E. Houston, J.W. Rogers Jr., R.R. Rye, F.L. Hutson, and D.E. Ramaker Phys. Rev. B 34 1986 1215
4. J.S. Murday, B.I. Dunlap, F.L. Hutson, and P. Oelhafen Phys. Rev. B 24 1981 4764
5. D.E. Ramaker Phys. Scr. T41 1992 77
6. R.R. Rye, D.R. Jennison, and J.E. Hutson J. Chem. Phys. 73 1980 4867
7. G.M. Mikhailov, Yu. G. Borod'ko, S.L. Zimont, S.V. Khristenko, and S.I. Vetchinkin J. Electron. Spectrosc. Relat. Phenom. 46 1988 145
8. J.C. Lascovich, R. Giorgi, and S. Scaglione Appl. Surf. Sci. 47 1991 17
9. G. Speranza, and N. Laidani Diamond Relat. Mater. 13 2004 451
10. A.P. Dementjev New Diamond Frontier Carbon Technol. 11 2001 37
11. L. Calliari, G. Speranza, J.C. Lascovich, and A. Santoni Surf. Sci. 501 2002 253
12. C.J. Powell, and A. Jablonski NIST Electron Inelastic-Mean-Free-Path Database, Version 1.1 2000 National Institute of Standards and Technology Gaithersburg, MD
13. M.T. Anthony D. Briggs M.P. Seah Appendix 1 in Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy 1983 Wiley Chichester
14. G. Speranza, private communication.
15. J.-C. Charlier, X. Gonze, and J.-P. Michenaud Phys. Rev. B 43 1991 4579
16. D.D.L. Chung J. Mater. Sci. 37 2002 1475
17. A.R. Law, M.T. Johnson, and H.P. Hughes Phys. Rev. B 34 1986 4289
18. T. Takahashi, H. Tokailin, and T. Sagawa Phys. Rev. B 32 1985 8317
19. D. Marchand, C. Frétigny, M. Laguës, F. Batallan, C. Simon, I. Rosenman, and R. Pincaux Phys. Rev. B 30 1984 4788
20. N.-Y. Cui, and N.M.D. Brown J. Electron Spectrosc. Relat. Phenom. 127 2002 93
21. H.J. Mamin, E. Ganz, D.W. Abraham, R.E. Thomson, and J. Clarke Phys. Rev. B 34 1986 9015
22. S. Hofmann Depth profiling D. Briggs M.P. Seah Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy 1983 164 (Chapter 4)
23. V.V. Nemoshkalenko, and V.G. Aleshin Elektronnaya Spektroscopya Krystallov 1983 (in Russian)
24. C.J. Powell Scanning Electron Microsc. 4 1984 1649
25. A. Jablonski, and H. Ebel Surf. Interface Anal. 11 1988 627
26. P. Puschnig, and C. Ambrosch-Draxl Phys. Rev. B 60 1999 7891
27. M. Knupfer Surf. Sci. Rep. 42 2001 1
28. H. Kudo, K. Haruyama, T. Kinoshita, S. Seki, K. Narumi, and H. Naramoto Nucl. Instrum. Meth. Phys. Res. B190 2002 160