Crystallinity effects on primary beam and Auger electron signal intensities observed for graphite

Journal of Electron Spectroscopy and Related Phenomena

Volumn 127, Issue 1-2, 2002, Pages 93-101

  Cui, Nai Yi ^a   Brown, Norman M D ^a  

^a UNIVERSITY OF ULSTER   (United Kingdom)

Author keywords

Auger; CMA; Forward focusing; Image contrast

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; BACKSCATTERING; CRYSTALLINE MATERIALS; DIFFRACTION; LATTICE CONSTANTS; SCANNING ELECTRON MICROSCOPY;

BACKSCATTERED ELECTRON IMAGES (BSE); SCANNING AUGER ELECTRON MICROSCOPE (SAM);

GRAPHITE;

EID: 0036841129     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(02)00177-9     Document Type: Article

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