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Volumn 86, Issue 8, 2005, Pages 1-3

Growth, structure, and properties of all-epitaxial ferroelectric (Bi,La)4 Ti3 O12 Pb (Zr0.4 Ti0.6) O3 (Bi,La)4 Ti3 O12 trilayered thin films on SrRu O3 -covered SrTi O3 (011) substrates

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLOGRAPHY; ELECTROMAGNETIC WAVE POLARIZATION; EPITAXIAL GROWTH; FERROELECTRIC MATERIALS; PULSED LASER DEPOSITION; SUBSTRATES; X RAY DIFFRACTION;

EID: 17044425044     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1864248     Document Type: Article
Times cited : (52)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.