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Volumn 86, Issue 8, 2005, Pages 1-3
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Growth, structure, and properties of all-epitaxial ferroelectric (Bi,La)4 Ti3 O12 Pb (Zr0.4 Ti0.6) O3 (Bi,La)4 Ti3 O12 trilayered thin films on SrRu O3 -covered SrTi O3 (011) substrates
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTALLOGRAPHY;
ELECTROMAGNETIC WAVE POLARIZATION;
EPITAXIAL GROWTH;
FERROELECTRIC MATERIALS;
PULSED LASER DEPOSITION;
SUBSTRATES;
X RAY DIFFRACTION;
FERROELECTRIC FILMS;
FERROELECTRIC MEMORY DEVICES;
FERROELECTRIC TESTERS;
TRILAYERS;
THIN FILMS;
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EID: 17044425044
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1864248 Document Type: Article |
Times cited : (52)
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References (17)
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