Microwave dielectric mechanism studied by microwave near-field microscopy and Raman spectroscopy

Journal of Electroceramics

Volumn 13, Issue 1-3, 2004, Pages 281-286

  Chen, Yi Chun ^a,b   Yao, Yeong Der ^b   Hsieh, Yun Shuo ^a   Cheng, Hsiu Fung ^a   Chia, Chih Ta ^a   Lin, I Nan ^c  

^a NATIONAL TAIWAN NORMAL UNIVERSITY   (Taiwan)

^b INSTITUTE OF PHYSICS   (Taiwan)

^c TAMKANG UNIVERSITY   (Taiwan)

Author keywords

Evanescent microwave microscopy; Microwave dielectrics; Raman spectroscopy

Indexed keywords

CERAMIC MATERIALS; CRYSTAL DEFECTS; DIELECTRIC PROPERTIES; FREQUENCIES; OPTICAL MICROSCOPY; PEROVSKITE; RAMAN SPECTROSCOPY; RESONATORS;

EVANESCENT MICROWAVE MICROSCOPY; QUALITY FACTOR; STRUCTURAL DISORDER; VACANCIES;

MICROWAVES;

EID: 17044405866     PISSN: 13853449     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10832-004-5113-z     Document Type: Conference Paper

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