SCOPUS 정보 검색 플랫폼

Volumn 7, Issue , 2004, Pages 983-990

Dissecting a compositionally graded sige virtual substrate by X-ray reciprocal space mapping

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; DIFFRACTOMETERS; DISLOCATIONS (CRYSTALS); OPTICAL MICROSCOPY; RELAXATION PROCESSES; STRAIN; SUBSTRATES; X RAY DIFFRACTION;

BUFFER LAYERS; GROWTH TEMPERATURES; RELAXATION MECHANISMS; VIRTUAL SUBSTRATES;

SILICON ALLOYS;

EID: 17044402620 PISSN: None EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (1)

References (14)

1
- 0342853202
- F. Schäffle, Semi. Sci. & Technol., 12, 1515 (1997).
- (1997) Semi. Sci. & Technol. , vol.12 , pp. 1515
- Schäffle, F.¹

2
- 0034704210
- G. Dehlinger, L. Diehl, U. Gennser, H. Sigg, J. Faist, K. Ensslin, D. Grutzmacher, E. Muller, Science, 290, 2277 (2000); F. Schäffler, Thin Solid Films, 321, 1 (1998).
- (2000) Science , vol.290 , pp. 2277
- Dehlinger, G.¹ Diehl, L.² Gennser, U.³ Sigg, H.⁴ Faist, J.⁵ Ensslin, K.⁶ Grutzmacher, D.⁷ Muller, E.⁸

3
- 0032068822
- G. Dehlinger, L. Diehl, U. Gennser, H. Sigg, J. Faist, K. Ensslin, D. Grutzmacher, E. Muller, Science, 290, 2277 (2000); F. Schäffler, Thin Solid Films, 321, 1 (1998).
- (1998) Thin Solid Films , vol.321 , pp. 1
- Schäffler, F.¹

4
- 0343578945
- E. A. Fitzgerald, Y.-H. Xie, M. L. Green, D. Brasen, A. R. Kortan, J. Michel, Y.-J Mii, and B. E. Weir, Appl. Phys. Lett., 59, 811 (1991).
- (1991) Appl. Phys. Lett. , vol.59 , pp. 811
- Fitzgerald, E.A.¹ Xie, Y.-H.² Green, M.L.³ Brasen, D.⁴ Kortan, A.R.⁵ Michel, J.⁶ Mii, Y.-J.⁷ Weir, B.E.⁸

5
- 21544472035
- J. Tersoff, Appl. Phys. Lett., 62, 693 (1993).
- (1993) Appl. Phys. Lett. , vol.62 , pp. 693
- Tersoff, J.¹

6
- 84967874087
- J. Zhang, A. Marinopoulou, J. Hartung, E.G. Lightowlers, N. Anwar, G. Parry, M.H. Xie, S.M. Mokler, X.D. Wu and B.A. Joyce, J. Vac. Sci. & Technol., A12, 1139 (1994).
- (1994) J. Vac. Sci. & Technol. , vol.A12 , pp. 1139
- Zhang, J.¹ Marinopoulou, A.² Hartung, J.³ Lightowlers, E.G.⁴ Anwar, N.⁵ Parry, G.⁶ Xie, M.H.⁷ Mokler, S.M.⁸ Wu, X.D.⁹ Joyce, B.A.¹⁰

7
- 0035399254
- N.J. Woods, G. Breton, H. Graoui, J. Zhang, J. Cryst. Growth, 227, 735 (2001).
- (2001) J. Cryst. Growth , vol.227 , pp. 735
- Woods, N.J.¹ Breton, G.² Graoui, H.³ Zhang, J.⁴

8
- 0016951699
- D.G. Shimmel, J. Electrochem. Soc., 123, 734 (1976).
- (1976) J. Electrochem. Soc. , vol.123 , pp. 734
- Shimmel, D.G.¹

9
- 28444459024
- th Edition), Butterworth-Heinemann (2001).
- (1992) J. Appl. Phys. , vol.71 , pp. 4230
- LeGoues, F.K.¹ Meyerson, B.S.² Morar, J.F.³ Kirchner, P.D.⁴

10
- 28444459024
- Butterworth-Heinemann
- th Edition), Butterworth-Heinemann (2001).
- (2001) th Edition)
- Hull, D.¹ Backon, D.J.²

11
- 0032297364
- D.J. Wallis, D.J. Robbins, A.J. Pidduck, G.M. Williams, A. Churchill and J. Newey, Mat. Res. Soc. Sym. Proc., 533, 77 (1998).
- (1998) Mat. Res. Soc. Sym. Proc. , vol.533 , pp. 77
- Wallis, D.J.¹ Robbins, D.J.² Pidduck, A.J.³ Williams, G.M.⁴ Churchill, A.⁵ Newey, J.⁶

12
- 0000380105
- P.M. Mooney, J.K. Jordan-Sweet, I.C. Noyan, S.K. Kaldor, P.-C. Wang, Appl. Phys. Lett., 74, 726 (1999).
- (1999) Appl. Phys. Lett. , vol.74 , pp. 726
- Mooney, P.M.¹ Jordan-Sweet, J.K.² Noyan, I.C.³ Kaldor, S.K.⁴ Wang, P.-C.⁵

13
- 79955991283
- H.L. Seng, T. Osipowicz, T.C. Sum, E.S. Tok, G. Breton, N.J. Woods, J. Zhang, Appl. Phys. Lett., 80, 2940 (2002).
- (2002) Appl. Phys. Lett. , vol.80 , pp. 2940
- Seng, H.L.¹ Osipowicz, T.² Sum, T.C.³ Tok, E.S.⁴ Breton, G.⁵ Woods, N.J.⁶ Zhang, J.⁷

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