Processing and dielectric properties of sol-gel derived PMN-PT (68:32) thin films

Journal of Electroceramics

Volumn 13, Issue 1-3, 2004, Pages 503-507

  Goel, T C ^a   Kumar, Pawan ^a   James, A R ^b   Prakash, Chandra ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

^b SOLID STATE PHYSICS LABORATORY   (India)

Author keywords

Ferroelectric films; MPB; PMN PT; Relaxors; Sol gel

Indexed keywords

ANNEALING; DIELECTRIC MATERIALS; DYNAMIC RANDOM ACCESS STORAGE; SCANNING ELECTRON MICROSCOPY; SOL-GELS; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

FERROELECTRIC FILMS; LEAD-MAGNESIUM NIOBATE-LEAD TITANATE (PMN-PT); MICROFABRICATED DEVICES; MORPHOTROPIC PHASE BOUNDARY (MPB);

PIEZOELECTRIC MATERIALS;

EID: 17044361812     PISSN: 13853449     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10832-004-5148-1     Document Type: Conference Paper

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