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Volumn 95, Issue 3, 2003, Pages 464-469
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Integral Equation Method in Near-Field Optical Microscopy of Scattering
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTROMAGNETIC FIELDS;
INTEGRAL EQUATIONS;
OPTICAL MICROSCOPY;
PROBLEM SOLVING;
SCANNING;
SILICON CARBIDE;
NEAR-FIELD MICROSCOPY;
LIGHT SCATTERING;
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EID: 0242440759
PISSN: 0030400X
EISSN: None
Source Type: Journal
DOI: 10.1134/1.1613015 Document Type: Article |
Times cited : (2)
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References (19)
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