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Volumn 95, Issue 3, 2003, Pages 464-469

Integral Equation Method in Near-Field Optical Microscopy of Scattering

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC FIELDS; INTEGRAL EQUATIONS; OPTICAL MICROSCOPY; PROBLEM SOLVING; SCANNING; SILICON CARBIDE;

EID: 0242440759     PISSN: 0030400X     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1613015     Document Type: Article
Times cited : (2)

References (19)
  • 6
    • 0141448747 scopus 로고    scopus 로고
    • O. N. Gadomskiǐ and K. Yu. Moiseev, Opt. Spektrosk. 93, 163 (2002) [Opt. Spectrosc. 93, 153 (2002)].
    • (2002) Opt. Spectrosc. , vol.93 , pp. 153
  • 7
    • 0242542788 scopus 로고    scopus 로고
    • S. V. Sukhov, Opt. Spektrosk. 90, 817 (2001) [Opt. Spectrosc. 90, 735 (2001)].
    • (2001) Opt. Spektrosk. , vol.90 , pp. 817
    • Sukhov, S.V.1
  • 8
    • 0141651531 scopus 로고    scopus 로고
    • S. V. Sukhov, Opt. Spektrosk. 90, 817 (2001) [Opt. Spectrosc. 90, 735 (2001)].
    • (2001) Opt. Spectrosc. , vol.90 , pp. 735


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.