EPR studies of point defects in Cu-III-VI2 chalcopyrite semiconductors

Materials Science in Semiconductor Processing

Volumn 6, Issue 5-6, 2003, Pages 335-338

  Sato, K ^a  

^a TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY   (Japan)

Author keywords

Chalcopyrite semiconductors; Electron paramagnetic resonance; Photoluminescence

Indexed keywords

BINDING ENERGY; COPPER; ELECTROMAGNETIC WAVE ABSORPTION; PARAMAGNETIC RESONANCE; PHOTOIONIZATION; PHOTOLUMINESCENCE; POINT DEFECTS; SEMICONDUCTOR GROWTH; SPECTRUM ANALYSIS;

CHALCOPYRITE SEMICONDUCTORS;

SEMICONDUCTOR MATERIALS;

EID: 1642634105     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mssp.2003.07.024     Document Type: Conference Paper

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