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Volumn 75, Issue 1-2, 2003, Pages 135-143

Study of point defects in CuGaSe2 single crystals by means of electron paramagnetic resonance and photoluminescence

Author keywords

Chalcopyrite crystals; Electron paramagnetic resonance (EPR); Photo EPR; Photoluminescence (PL); Point defects and defect pairs

Indexed keywords

ANNEALING; CHARACTERIZATION; COPPER COMPOUNDS; PARAMAGNETIC RESONANCE; PHOTOLUMINESCENCE; POINT DEFECTS; SINGLE CRYSTALS; SPECTRUM ANALYSIS; THERMAL EFFECTS;

EID: 0037209865     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(02)00123-X     Document Type: Article
Times cited : (7)

References (22)
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  • 15
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    • Optically induced migration of interstitial zinc in ZnSe: Caught in the act
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    • (1998) Phys. Rev. Lett. , vol.81 , pp. 2084-2087
    • Chow, K.H.1    Watkins, G.D.2
  • 17
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    • Cromium in II-VI compounds
    • Pantelides S.T. New York: Gordon and Breach Science
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  • 18
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    • 2 epitaxial films: Molecular beam epitaxial growth and intrinsic properties
    • Salford, UK, Institute of Physics Conference, Series No. 152, IOP Publisher, Bristol
    • 2 epitaxial films: molecular beam epitaxial growth and intrinsic properties, in: Proceedings of the ICTMC-11, Salford, UK, 1997, Institute of Physics Conference, Series No. 152, IOP Publisher, Bristol, 1998, pp. 221-227.
    • (1997) Proceedings of the ICTMC-11 , pp. 221-227
    • Niki, S.1    Fons, P.J.2    Yamada, A.3    Suzuki, R.4    Ohdaira, T.5    Ishibashi, S.6    Oyanagi, H.7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.