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Volumn 59, Issue 19, 1999, Pages 12268-12271

Low-temperature electron-paramagnetic-resonance study of extrinsic and intrinsic defects in (formula presented)

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EID: 0000090661     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.12268     Document Type: Article
Times cited : (24)

References (31)
  • 4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.