Characterization of Ni-Doped BST Thin Films on LSCO Buffer Layers Prepared by Pulsed Laser Deposition

Electrochemical and Solid-State Letters

Volumn 7, Issue 2, 2004, Pages

  Kim, Hyun Suk ^a   Lim, Mi Hwa ^a   Kim, Ho Gi ^a   Kim, Il Doo ^b  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; DIELECTRIC LOSSES; DOPING (ADDITIVES); ELECTRODES; LEAKAGE CURRENTS; NICKEL; PERMITTIVITY; PEROVSKITE; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

BUFFER LAYERS; DIELECTRIC LOSS;

THIN FILMS;

EID: 1642585912     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1635094     Document Type: Article

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