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Volumn 762, Issue , 2003, Pages 247-252

Threshold Voltage Performance of a-Si:H TFTs for Analog Applications

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; DEFECTS; ELECTRIC CURRENTS; ELECTRIC FIELDS; ELECTRIC LOADS; GATES (TRANSISTOR); IMAGE SENSORS; IMAGING SYSTEMS; LIGHT EMITTING DIODES; LINEAR SYSTEMS; MEDICAL IMAGING; THRESHOLD VOLTAGE;

EID: 1642581757     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-762-a20.4     Document Type: Conference Paper
Times cited : (4)

References (18)
  • 13
    • 0242521605 scopus 로고    scopus 로고
    • Drain bias dependence of threshold voltage stability of amorphous silicon thin-film transistors
    • in review
    • K.S. Karim, A. Nathan, M. Hack, W.I. Milne, "Drain bias dependence of threshold voltage stability of amorphous silicon thin-film transistors, " App. Phys. Lett., in review.
    • App. Phys. Lett.
    • Karim, K.S.1    Nathan, A.2    Hack, M.3    Milne, W.I.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.