Lifetime measurements of stain etched and passivated porous silicon

Materials Research Society Symposium - Proceedings

Volumn 762, Issue , 2003, Pages 753-758

  Guerrero Lemus, Ricardo ^a   Ben Handen, Fathi A ^b   Ballif, Cristoffer ^c   Kenanoglu, Ali ^c   Borchert, Dietmar ^c   Hernández Rodríguez, Cecilio ^a   Rodríguez, Tomás ^d   Martínez Duart, José M ^b  

^a UNIVERSIDAD DE LA LAGUNA   (Spain)

^b UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^c FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS   (Germany)

^d UNIVERSIDAD POLITÉCNICA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIREFLECTION COATINGS; DEGRADATION; DOPING (ADDITIVES); ELECTROLUMINESCENCE; ETCHING; OXIDATION; PASSIVATION; PHOTOLUMINESCENCE; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; REFRACTIVE INDEX; SOLAR CELLS; SPECTROMETERS; STRAIN;

NITRIDATION; PHOTOCARRIERS; PHOTOCONDUCTION DECAY;

POROUS SILICON;

EID: 1642581668     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-762-a17.15     Document Type: Conference Paper

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