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Volumn 197, Issue 2, 2003, Pages 409-413
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Photoluminescence and AFM characterisation of the initial stages of porous silicon stain etching
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Author keywords
[No Author keywords available]
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Indexed keywords
ANTIREFLECTION COATINGS;
ATOMIC FORCE MICROSCOPY;
ETCHING;
MORPHOLOGY;
PHOTOLUMINESCENCE;
PHOTOVOLTAIC CELLS;
SOLAR CELLS;
SURFACE ROUGHNESS;
SURFACES;
PHOTOCONVERSION CENTER;
PHOTOLUMINESCENT INTENSITY;
POROUS SURFACE;
STAIN ETCHING;
POROUS SILICON;
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EID: 0037933422
PISSN: 00318965
EISSN: None
Source Type: Journal
DOI: 10.1002/pssa.200306535 Document Type: Conference Paper |
Times cited : (11)
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References (16)
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