Measurement and analysis of the characteristics parameters for the porous silicon/silicon using photovoltage spectra

Applied Surface Science

Volumn 158, Issue 3, 2000, Pages 268-274

  Suntao, Wu ^a   Yanhua, Wang ^a   Qihua, Shen ^a  

^a XIAMEN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CARRIER CONCENTRATION; ELECTRIC VARIABLES MEASUREMENT; ETCHING; HETEROJUNCTIONS; LUMINESCENCE; SEMICONDUCTING SILICON; SPECTRUM ANALYSIS;

CARRIER LIFETIME; ELECTROCHEMICAL ANODE ETCHING; PHOTOVOLTAGE SPECTRA;

POROUS SILICON;

EID: 0033714704     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00008-8     Document Type: Article

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