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Volumn 95-96, Issue , 2004, Pages 459-464

Effect of Dynamic Aging of Dislocations on the Deformation Behavior of Extrinsic Semiconductors

Author keywords

Dynamic Strain Aging; Solute Hardened Silicon; Upper Yield Stress

Indexed keywords

AGING OF MATERIALS; CRYSTAL GROWTH FROM MELT; CRYSTAL IMPURITIES; DEFORMATION; ITERATIVE METHODS; SEMICONDUCTING SILICON; STRAIN RATE; VECTORS; YIELD STRESS;

EID: 1642515958     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (19)
  • 2
    • 0000541543 scopus 로고
    • Ed. F.R.N. Nabarro (North-Holland. Amsterdam-Oxford-New York-Tokyo) Chapter 35
    • H Alexander. Dislocations in solids. Vol. 7. Ed. F.R.N. Nabarro (North-Holland. Amsterdam-Oxford-New York-Tokyo. 1986) Chapter 35. P. 113.
    • (1986) Dislocations in Solids , vol.7 , pp. 113
    • Alexander, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.