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Volumn 68, Issue 21, 2003, Pages

Effect of ion bombardment on stress in thin metal films

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; GLASS; METAL; NIOBIUM; SILVER; ZIRCONIUM;

EID: 1642452983     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.68.214105     Document Type: Article
Times cited : (64)

References (48)
  • 18
    • 85038974518 scopus 로고    scopus 로고
    • While it has been recently shown that viscous relaxation does not require melting, but can proceed simply from the creation of defects (Ref. 9), the same basic concept of radiation-induced viscous flow remains valid
    • While it has been recently shown that viscous relaxation does not require melting, but can proceed simply from the creation of defects (Ref. 9), the same basic concept of radiation-induced viscous flow remains valid.
  • 29
    • 85039018771 scopus 로고    scopus 로고
    • SRIM 2000 computer code; see Ref. 35 for details
    • SRIM 2000 computer code; see Ref. 35 for details.
  • 30
    • 85039020554 scopus 로고    scopus 로고
    • Also the implantation of inert gases into the metal films leads to generation of compressive stresses. Even for the highest irradiation doses, however, they are an order of magnitude smaller than measured stresses
    • Also the implantation of inert gases into the metal films leads to generation of compressive stresses. Even for the highest irradiation doses, however, they are an order of magnitude smaller than measured stresses.
  • 31
    • 85039022459 scopus 로고    scopus 로고
    • This energy is typically required to create unstable point defects and is lower than the energy for creation of stable point defects
    • This energy is typically required to create unstable point defects and is lower than the energy for creation of stable point defects.
  • 32
    • 85038992794 scopus 로고    scopus 로고
    • MD code; see, e.g., Ref. 47
    • MD code; see, e.g., Ref. 47.
  • 40
    • 85039021365 scopus 로고    scopus 로고
    • The noise in the stress data, which is observed for high doses, originates from fluctuations in the ion fux of the accelerator. For high doses the integration time constant of the capacitance measurement was increased, leading to a reduced noise level
    • The noise in the stress data, which is observed for high doses, originates from fluctuations in the ion fux of the accelerator. For high doses the integration time constant of the capacitance measurement was increased, leading to a reduced noise level.
  • 43
    • 85039015698 scopus 로고    scopus 로고
    • Diplomarbeit, Augsburg
    • O. Müller, Diplomarbeit, Augsburg (1996).
    • (1996)
    • Müller, O.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.