Surface topography of amorphous Zr65.0 Al7.5Cu27.5 alloy films around the glass transition - An in-situ UHV-STM study

Thin Solid Films

Volumn 275, Issue 1-2, 1996, Pages 240-243

  Reinker, B ^a   Geisler, H ^a   Moske, M ^a   Samwer, K ^a  

^a UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

Alloys; Amorphous; Metals; Surface structure

Indexed keywords

ANNEALING; DEPOSITION; ELECTRON BEAMS; GLASS TRANSITION; METALLIC GLASS; METALS; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE; TEMPERATURE; ZIRCONIUM ALLOYS;

AMORPHOUS ZIRCONIUM ALUMINUM COPPER ALLOY FILM; ELECTRON BEAM DEPOSITION; SUPERCOOLED LIQUID REGION; SURFACE TOPOGRAPHY; THERMALLY OXIDIZED SILICON SUBSTRATES; ULTRAHIGH VACUUM;

AMORPHOUS FILMS;

EID: 0030121820     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)07053-2     Document Type: Article

References (6)

1. A. Inoue, T. Zhang and T. Masumoto, Mater. Sci. Eng., A134 (1991) 1125.
2. A. Peker and W.L. Johnson, Appl. Phys. Lett., 63 (1993) 2342.
3. A. Inoue, T. Zhang and T. Masumoto, J. Non-Cryst. Solids, 150 (1992) 396.
4. A. Inoue, D. Kawase, A.P. Tsai, T. Zhang and T. Masumoto, Mater. Sci. Eng., A178 (1994) 255.
5. R. Rambousky, M. Moske and K. Samwer, Z. Phys. 99 (1996) 387.
6. B. Reinker, M. Moske, H. Geisler and K. Samwer, Mater. Res. Soc. Symp.Proc., 555(1995)601.