SCOPUS 정보 검색 플랫폼

Volumn 88, Issue 2-3, 2002, Pages 173-176

A new tool for measuring island dimensions and spatial correlations in quantum dot multilayers: Raman scattering interferences

(6) Cazayous, M a Groenen, J a Huntzinger, J R a Mlayah, A a Denker, U b Schmidt, O G b

a UNIVERSITÉ PAUL SABATIER (France)

b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG (Germany)

Author keywords

Quantum dots; Raman interferences; Spatial correlations

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; ELECTRON ENERGY LEVELS; MOLECULAR BEAM EPITAXY; MULTILAYERS; RAMAN SCATTERING; SCANNING ELECTRON MICROSCOPY; SELF ASSEMBLY; SEMICONDUCTOR QUANTUM DOTS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

RAMAN INTERFERENCES; SPATIAL CORRELATIONS;

MATERIALS SCIENCE;

EID: 1642400627 PISSN: 09215107 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-5107(01)00888-1 Document Type: Conference Paper

Times cited : (7)

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