Vertical correlation of SiGe islands in SiGe/Si superlattices: X-ray diffraction versus transmission electron microscopy

Applied Physics Letters

Volumn 77, Issue 24, 2000, Pages 3953-3955

  Stangl, J ^a   Roch, T ^a   Bauer, G ^a   Kegel, I ^b   Metzger, T H ^b   Schmidt, O G ^c   Eberl, K ^c   Kienzle, O ^d   Ernst, F ^d  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^b UNIVERSITY OF MUNICH   (Germany)

^c MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^d MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000327738     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1333683     Document Type: Article

References (10)

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