W/B4C, W/C, W/Si multilayers

Guangxue Jingmi Gongcheng/Optics and Precision Engineering

Volumn 13, Issue 1, 2005, Pages 28-33

  Wang, Feng Li ^a   Wang, Zhan Shan ^a   Zhang, Zhong ^a   Wu, Wen Juan ^a   Wang, Hong Chang ^a   Zhang, Shu Min ^a   Qin, Shu Ji ^a   Chen, Ling Yan ^a  

^a TONGJI UNIVERSITY   (China)

Author keywords

Multilayer; Synchrotron radiation; Transmission electron microscope; X ray diffraction

Indexed keywords

BORON CARBIDE; CARBON; MAGNETRON SPUTTERING; MICROSTRUCTURE; MULTILAYERS; OPTICAL PROPERTIES; SILICON; SYNCHROTRON RADIATION; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTEN; X RAY DIFFRACTION ANALYSIS;

MATERIAL COMBINATION; MULTILAYER FILMS FABRICATION;

FILM PREPARATION;

EID: 15944428576     PISSN: 1004924X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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