Normal-incidence reflectance of optimized W/B4C x-ray multilayers in the range 1.4 nm < λ < 2.4 nm

Optics Letters

Volumn 27, Issue 24, 2002, Pages 2212-2214

  Windt, David L ^a   Gullikson, Eric M ^b   Walton, Christopher C ^c  

^a Och Spine at New York Presbyterian Hospitals   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BORON COMPOUNDS; INTERFACES (MATERIALS); LIGHT REFLECTION; OPTICAL MATERIALS; TUNGSTEN; X RAY OPTICS;

SOFT X-RAYS;

MULTILAYERS;

EID: 0037115187     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.27.002212     Document Type: Article

References (11)

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