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Volumn 275, Issue 1-2, 2005, Pages
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3D global analysis of CZ-Si growth in a transverse magnetic field with various crystal growth rates
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Author keywords
A1. Computer simulation; A1. Interfaces; A1. Magnetic fields; A2. Magnetic field assisted Czochralski method; B2. Semiconducting silicon
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Indexed keywords
BOUNDARY CONDITIONS;
COMPUTER SIMULATION;
HEATING EQUIPMENT;
INTERFACES (MATERIALS);
MAGNETIC FIELD EFFECTS;
MATHEMATICAL MODELS;
SEMICONDUCTING SILICON;
THERMAL EFFECTS;
CRYSTAL GROWTH RATE;
INTERFACES;
MAGNETIC FIELD ASSISTED CZOCHRALSKI METHOD;
THREE DIMENSIONAL (3D) MELTING;
CRYSTAL GROWTH;
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EID: 15944415400
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2004.11.185 Document Type: Conference Paper |
Times cited : (25)
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References (12)
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