![]() |
Volumn 163, Issue 3, 1996, Pages 238-242
|
Oxygen transfer during single silicon crystal growth in Czochralski system with vertical magnetic fields
a
NEC CORPORATION
(Japan)
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ABSORPTION SPECTROSCOPY;
COMPUTER SIMULATION;
HEAT CONVECTION;
MAGNETIC FIELDS;
OXYGEN;
SEMICONDUCTING SILICON;
THERMAL EFFECTS;
THREE DIMENSIONAL;
TRANSPORT PROPERTIES;
BENARD CELL;
BENARD INSTABILITY;
INFRARED ABSORPTION TECHNIQUE;
MELT CONVECTION;
OXYGEN TRANSFER;
SILICON CRYSTAL GROWTH;
CRYSTAL GROWTH FROM MELT;
|
EID: 0030164959
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/0022-0248(95)00976-0 Document Type: Article |
Times cited : (63)
|
References (15)
|