The effect of Al 2O 3 barrier layers in TiO 2/Dye/CuSCN photovoltage cells explored by recombination and DOS characterization using transient photovoltage measurements

Journal of Physical Chemistry B

Volumn 109, Issue 10, 2005, Pages 4616-4623

  O'Regan, B C ^a   Scully, S ^a   Mayer, A C ^a   Palomares, E ^b   Durrant, J ^b  

^a TNO   (Netherlands)

^b IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE-EXTRACTION METHOD; ELECTROLYTE CELLS; TRANSIENT PHOTOVOLTAGE MEASUREMENTS; TRAP DENSITY;

ALUMINUM COMPOUNDS; ATMOSPHERIC HUMIDITY; CAPACITANCE; DEPOSITION; ELECTROLYTES; ELECTRON TUNNELING; PHOTOCURRENTS; RATE CONSTANTS; SHORT CIRCUIT CURRENTS; SOLAR CELLS; TITANIUM DIOXIDE;

PHOTOVOLTAIC CELLS;

EID: 15944383750     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0468049     Document Type: Article

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