LEPTOS: A universal software for X-ray reflectivity and diffraction

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5536, Issue , 2004, Pages 1-15

  Ulyanenkov, Alex ^a  

^a BRUKER AXS GMBH   (Germany)

Author keywords

Data fitting; High resolution x ray diffraction; Thin film analysis; X ray reflectivity

Indexed keywords

COMPUTER SIMULATION; COMPUTER SOFTWARE; CRYSTALLOGRAPHY; DIFFRACTOMETERS; GRAPHICAL USER INTERFACES; PARAMETER ESTIMATION; REFLECTION;

DATA FITTINGS; HIGH-RESOLUTION X-RAY DIFFRACTION; LEPTOS; THIN FILM ANALYSIS; X-RAY REFLECTIVITY;

X RAY DIFFRACTION;

EID: 15844390928     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.563302     Document Type: Conference Paper

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