A new method for calculation of crystal susceptibilities for x-ray diffraction at arbitrary wavelength

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 58, Issue 4, 2002, Pages 370-384

  Feranchuk, I D ^a   Gurskii, L I ^a   Komarov, L I ^a   Lugovskaya, O M ^a   Burgazy F ^a   Ulyanenkov, Alex ^a  

^a Byelorussian AXS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURACY; ANALYTIC METHOD; ANISOTROPY; ARTICLE; CALCULATION; CRYSTAL STRUCTURE; RADIATION; WAVEFORM; X RAY DIFFRACTION;

EID: 0036066479     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767302007997     Document Type: Article

References (34)