Description of x-ray reflection and diffraction from periodical multilayers and superlattices by the eigenwave method

Physical Review B - Condensed Matter and Materials Physics

Volumn 68, Issue 23, 2003, Pages

  Feranchuk, I D ^a   Feranchuk, S I ^a   Minkevich, A A ^a   Ulyanenkov, A ^b  

^a BELARUSIAN STATE UNIVERSITY   (Belarus)

^b BRUKER AXS GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM ARSENIDE; ALUMINUM DERIVATIVE; ANTIMONY DERIVATIVE; ARSENIC DERIVATIVE; GALLIUM ANTIMONIDE; GALLIUM ARSENIDE; GERMANIUM; INDIUM ARSENIDE; SILICON; UNCLASSIFIED DRUG;

ANALYTIC METHOD; ARTICLE; CALCULATION; COMPUTER SIMULATION; ELECTROMAGNETIC FIELD; X RAY ANALYSIS; X RAY DIFFRACTION; X RAY REFLECTION;

EID: 0842343410     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.68.235307     Document Type: Article

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