Dynamic read destructive fault in embedded-SRAMs: Analysis and march test solution

Proceedings - Ninth IEEE European Test Symposium, ETS 2004

Volumn , Issue , 2004, Pages 140-145

  Dilillo, Luigi ^a   Girard, Patrick ^a   Pravossoudovitch, Serge ^a   Virazel, Arnaud ^a   Borri, Simone ^b   Hage Hassan, Magali ^b  

^a LIRMM   (France)

^b INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC FAULTS; READ EQUIVALENT STRESS (RES); SRAM ANALYSIS; VERY DEEP SUB-MICRON (VDSM);

ALGORITHMS; COMPUTATIONAL COMPLEXITY; EMBEDDED SYSTEMS; MATHEMATICAL MODELS; MICROPROCESSOR CHIPS;

STATIC RANDOM ACCESS STORAGE;

EID: 15844389174     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETSYM.2004.1347645     Document Type: Conference Paper

References (11)

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