Importance of dynamic faults for new SRAM technologies

Proceedings of the European Test Workshop

Volumn 2003-January, Issue , 2003, Pages 29-34

  Hamdioui, S ^a,c   Wadsworth, R ^b   Delos Reyes, J ^c   Van De Goor, A J ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b STMICROELECTRONICS   (France)

^c INTEL CORPORATION   (United States)

Author keywords

Educational institutions; Fault detection; Information technology; Laboratories; Mathematical model; Microelectronics; Random access memory; SPICE; System testing; Systems engineering and theory

Indexed keywords

FAULT DETECTION; INFORMATION TECHNOLOGY; LABORATORIES; MATHEMATICAL MODELS; MICROELECTRONICS; RANDOM ACCESS STORAGE; SPICE;

DYNAMIC FAULTS; EDUCATIONAL INSTITUTIONS; FAULT PRIMITIVE; INDUSTRIAL TESTS; MEMORY TECHNOLOGY; RANDOM ACCESS MEMORY; SYSTEM TESTING; SYSTEMS ENGINEERING AND THEORIES;

STATIC RANDOM ACCESS STORAGE;

EID: 84942871379     PISSN: 15301877     EISSN: 15581780     Source Type: Conference Proceeding    
DOI: 10.1109/ETW.2003.1231665     Document Type: Conference Paper

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