Optical waveguide losses of PZT thin films with various Zr/Ti stoichiometries

Integrated Ferroelectrics

Volumn 15, Issue 1-4, 1997, Pages 281-288

  Teowee, G ^a   Boulton, J M ^a   Franke, E K ^a   Motakef, S ^b   Alexander, T P ^b   Bukowski, T J ^b   Uhlmann, D R ^b  

^a Donnelly Corporation   (United States)

^b University of Arizona   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FERROELECTRIC MATERIALS; HELIUM NEON LASERS; LEAD COMPOUNDS; MORPHOLOGY; OPTICAL WAVEGUIDES; PRISMS; REFRACTIVE INDEX; SOL-GELS; STOICHIOMETRY; THIN FILMS; ULTRAVIOLET SPECTROSCOPY; X RAY DIFFRACTION ANALYSIS;

LEAD ZIRCONATE TITANATE; OPTICAL LOSSES;

DIELECTRIC FILMS;

EID: 0031334087     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584589708015719     Document Type: Article

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