X-ray diffraction imaging of bulk polycrystalline materials

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 538, Issue 1-3, 2005, Pages 771-777

  Wroblewski, T ^a   Bjeoumikhov, A ^b  

^a DESY   (Germany)

^b Institute for Scientific Instruments GmbH   (Germany)

Author keywords

X ray diffraction; X ray imaging

Indexed keywords

DETECTORS; IMAGING TECHNIQUES; OPTICAL COLLIMATORS; OPTICAL RESOLVING POWER; RADIATION; THICKNESS MEASUREMENT; X RAY DIFFRACTION;

MICRO CHANNEL PLATE (MCP); POSITION SENSITIVE DETECTOR (PSD); SPATIAL RESOLUTION; X-RAY ENERGY;

POLYCRYSTALLINE MATERIALS;

EID: 15744406079     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2004.09.022     Document Type: Article

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