Strain mapping by diffraction imaging

Materials Science and Engineering A

Volumn 288, Issue 2, 2000, Pages 126-131

  Wroblewski, T ^a   Almanstotter J ^b   Clauss, O ^a   Moneke, M ^c   Pirling, T ^d   Schade, P ^b  

^a DESY   (Germany)

^b OSRAM GMBH   (Germany)

^c FRAUNHOFER INSTITUTE FOR STRUCTURAL DURABILITY AND SYSTEM RELIABILITY LBF   (Germany)

^d INSTITUT LAUE LANGEVIN   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; CRYSTALLIZATION; OPTICAL COLLIMATORS; TEXTURES; X RAY CRYSTALLOGRAPHY;

RECIPROCAL SPACE MAPPING; STRAIN MAPPING;

POLYCRYSTALLINE MATERIALS;

EID: 0034275954     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(00)00870-4     Document Type: Article

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