Processing of X-ray diffraction imaging data using remote sensing techniques

Journal of Materials Science Letters

Volumn 19, Issue 11, 2000, Pages 975-978

  Wroblewski, T ^a   Wild, E ^b   Poeste, T ^b   Pyzalla, A ^b  

^a DESY   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE PROCESSING; PHASE COMPOSITION; POLYCRYSTALLINE MATERIALS; REMOTE SENSING;

HYPERSPECTRAL IMAGES;

X RAY DIFFRACTION ANALYSIS;

EID: 0033738269     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1006724406926     Document Type: Article

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