Parallel atomic force microscopy with optical interferometric detection

Applied Physics Letters

Volumn 78, Issue 12, 2001, Pages 1787-1789

  Sulchek, T ^c   Grow, R J ^c   Yaralioglu, G G ^c   Minne, S C ^c   Quate, C F ^c   Manalis, S R ^a   Kiraz, A ^b   Aydine, A ^b   Atalar, A ^b  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b BILKENT UNIVERSITY   (Turkey)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035911460     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1352697     Document Type: Article

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