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Volumn 42, Issue 6, 2004, Pages 1033-1041

Ellipsometry Study of the Photo-Oxidation of Poly[(2-methoxy-5-hexyloxy)-p-phenylenevinylene]

Author keywords

Ellipsometry; FT IR; Luminescence; Photo oxidation; Poly(p phenylenevinylene); Refractive index

Indexed keywords

CHEMICAL BONDS; DEGRADATION; ELLIPSOMETRY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; IRRADIATION; LIGHT EMITTING DIODES; LUMINESCENCE; PHOTOOXIDATION; REFRACTIVE INDEX; THIN FILMS;

EID: 1542365422     PISSN: 08876266     EISSN: None     Source Type: Journal    
DOI: 10.1002/polb.10734     Document Type: Article
Times cited : (39)

References (35)
  • 16
    • 1542303171 scopus 로고
    • U.S.P.O. US Patent 5.189.136
    • Wudl, F.; Srdanov, G. U.S.P.O. US Patent 5.189.136, 1993.
    • (1993)
    • Wudl, F.1    Srdanov, G.2
  • 20


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.