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Volumn , Issue , 2001, Pages 87-93
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TDR Analysis of Advanced Microprocessors
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Author keywords
[No Author keywords available]
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Indexed keywords
CHIP SCALE PACKAGES;
ELECTRIC CONDUCTORS;
ELECTRIC REACTANCE MEASUREMENT;
ELECTRON MICROSCOPY;
FAILURE ANALYSIS;
FLIP CHIP DEVICES;
OPTICAL MICROSCOPY;
TIME DOMAIN ANALYSIS;
WAVEFORM ANALYSIS;
X RAY ANALYSIS;
DEVICE UNDER TEST (DUT);
DIGITAL OSCILLOSCOPES;
TIME DOMAIN REFLECTOMETRY (TDR);
MICROPROCESSOR CHIPS;
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EID: 1542360541
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (6)
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