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Volumn , Issue , 2001, Pages 87-93

TDR Analysis of Advanced Microprocessors

Author keywords

[No Author keywords available]

Indexed keywords

CHIP SCALE PACKAGES; ELECTRIC CONDUCTORS; ELECTRIC REACTANCE MEASUREMENT; ELECTRON MICROSCOPY; FAILURE ANALYSIS; FLIP CHIP DEVICES; OPTICAL MICROSCOPY; TIME DOMAIN ANALYSIS; WAVEFORM ANALYSIS; X RAY ANALYSIS;

EID: 1542360541     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (6)
  • 1
    • 1542300825 scopus 로고    scopus 로고
    • Time Domain Reflectrometry as a Device Packaging Level Failure Analysis and Failure Localization Tool
    • Searls., Time Domain Reflectrometry as a Device Packaging Level Failure Analysis and Failure Localization Tool, ISTFA Proceedings (2000)
    • (2000) ISTFA Proceedings
    • Searls1
  • 2
    • 1542270802 scopus 로고    scopus 로고
    • Electronic Package Failure Analysis Using TDR
    • D. Smolyansky, Electronic Package Failure Analysis Using TDR, ISTFA Proceedings (2000)
    • (2000) ISTFA Proceedings
    • Smolyansky, D.1
  • 3
    • 1542344273 scopus 로고    scopus 로고
    • TDR Techniques for Characterization and Modeling of Electronic Packaging
    • TDR Techniques for Characterization and Modeling of Electronic Packaging, TDA Systems Application Note
    • TDA Systems Application Note
  • 4
    • 1542344272 scopus 로고    scopus 로고
    • Electrical Sampling Modules User Manual
    • Electrical Sampling Modules User Manual. Tektronix
    • Tektronix
  • 5
    • 1542283998 scopus 로고    scopus 로고
    • Using TDR to Help Solve Signal Integrity Issues
    • Using TDR to Help Solve Signal Integrity Issues. Tektronix Applications Note
    • Tektronix Applications Note
  • 6
    • 1542270931 scopus 로고    scopus 로고
    • Comparative TDR Analysis as a Packaging FA Tool
    • C. Odegard, C. Lambert, Comparative TDR Analysis as a Packaging FA Tool, ISTFA Proceedings (1999)
    • (1999) ISTFA Proceedings
    • Odegard, C.1    Lambert, C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.