Time Domain Reflectometry as a Device Packaging Level Failure Analysis and Failure Localization Tool

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn , Issue , 2000, Pages 285-291

  Searls, Damion ^a   Don, Anura ^a   Dy, Emilie ^a   Goyal, Deepak ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATTENUATION; CAPACITANCE; CATHODE RAY OSCILLOSCOPES; COMPUTER AIDED DESIGN; ELECTRIC IMPEDANCE; FAILURE ANALYSIS; REFLECTOMETERS; SCANNING ELECTRON MICROSCOPY; USER INTERFACES; WAVEFORM ANALYSIS;

DEVICE UNDER TEST (DUT); FAILURE ANALYSIS (FA) RESOURCES; TIME DOMAIN REFLECTOMETRY (TDR);

TIME DOMAIN ANALYSIS;

EID: 1542300825     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

1. S. Pannala, A. Haridass, M. Swaminathan, "Parameter Extraction and Electrical Characterization of High Density Connector Using Time Domain Measurements", IEEE Transactions On Advanced Packaging, Vol. 22, No. 1, February 1999
2. Guideline for Measurement of Electronic Package Inductance and Capacitance Model Parameters, JEDEC Publication #123, JC-15 Committee, October 1995
3. M.D. Tilden, "Measuring Controlled-Impedance Boards with TDR," Printer Circuit Fabrication, February 1992
4. J.M. Jong, B. Jako, V.K. Tripathi, "Time-Domain Characterization and Circuit Modelling of a Multilayer Ceramic Package," IEEE Transactions of CPMT, Part B, Vol. 19, No. 1, February 1996, pp48-55
5. "TDR tools in Modeling Interconnects and Packages," - Tektronix Application Note, 1993
6. Dascher, D. "Measuring Parasitic Capacitance and Inductance Using TDR." Hewlett Packard Journal, April 1996, pp. 83-96.
7. Searls, D., C. Schuring, W. Hayashida, C.H. Tan, R. Hardin. "Time Domain Reflectometry as a Component Package Level Damage Detection Tool." InterPack'99 Proceedings. June 1999.
8. Odegard, C., C. Lambert. "Comparative TDR Analysis as a Packaging FA Tool." ISTFA Proceedings. November 1999.
9. Strickland, J. Time-Domain Reflectometry Measurements. Tektronix, Inc. Beaverton, Oregon. (1970).
10. H.W. Johnson and Martin Graham, High-Speed Digital Design, Prentice-Hall Inc. Upper Saddle River, New Jersey (1993).