메뉴 건너뛰기




Volumn 69, Issue 4, 2004, Pages

Evidence for interstitial hydrogen as the dominant electronic defect in nanometer alumina films

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM OXIDE; HYDROGEN;

EID: 1542344313     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.69.041405     Document Type: Article
Times cited : (49)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.