Parameter extraction and electrical characterization of high density connector using time domain measurements

IEEE Transactions on Advanced Packaging

Volumn 22, Issue 1, 1999, Pages 32-39

  Pannala, Sreemala ^a   Haridass, Anand ^a   Swaminathan, Madhavan ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Common mode; Connector; Cross talk; Differential mode; Lumped equivalent circuit; Time domain measurements

Indexed keywords

EID: 1542373429     PISSN: 15213323     EISSN: None     Source Type: Journal    
DOI: 10.1109/6040.746540     Document Type: Article

References (8)

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