Reconstruction of grains and subgrains from electron backscatter diffraction maps

Journal of Microscopy

Volumn 213, Issue 3, 2004, Pages 247-256

  Humphreys, F J ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Alignment; Boundaries; Connectivity; Electron backscatter diffraction; Grain boundary engineering; Grains; Microstructure; Quantitative metallography; Subgrains

Indexed keywords

BACKSCATTERING; ELECTRON DIFFRACTION; GRAIN BOUNDARIES;

BOUNDARY; CONNECTIVITY; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; GRAIN BOUNDARY ENGINEERING; MICROSTRUCTURAL INFORMATION; MISORIENTATIONS; QUANTITATIVE INFORMATION; QUANTITATIVE METALLOGRAPHY; SUBGRAINS;

MICROSTRUCTURE;

METAL;

AUTOMATION; CHEMICAL STRUCTURE; CONFERENCE PAPER; CORROSION; CRYSTALLOGRAPHY; DATA ANALYSIS; DIFFRACTION; ELECTRON; ELECTRON BACKSCATTER DIFFRACTION; GEOMETRY; IMAGE RECONSTRUCTION; PHYSICAL PARAMETERS; PRIORITY JOURNAL; STRESS; TECHNIQUE;

EID: 1542284603     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.0022-2720.2004.01297.x     Document Type: Conference Paper

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