Effects of phase change on reflection in phase-measuring interference microscopy

Applied Optics

Volumn 43, Issue 7, 2004, Pages 1503-1507

  Dubois, Arnaud ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; COMPUTATIONAL METHODS; COMPUTER SIMULATION; INTERFEROMETRY; LIGHT POLARIZATION; LIGHT REFLECTION; MICROSCOPES; MICROSCOPIC EXAMINATION; REFRACTIVE INDEX;

INTERFERENCE MICROSCOPY; LINNIK INTERFERENCE; MICROSCOPE INTERFEROGRAM; PHASE CHANGE;

LIGHT INTERFERENCE;

EID: 1542276634     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.43.001503     Document Type: Article

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