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Volumn 118, Issue 1-3, 2005, Pages 285-288

Application of tungsten slurry for copper-chemical mechanical polishing

Author keywords

Copper chemical mechanical polishing; Oxidizer; Tungsten slurry

Indexed keywords

COPPER; CORROSION; HYDROGEN PEROXIDE; MICROSTRUCTURE; OXIDATION; PARTICLE SIZE ANALYSIS; POLISHING; SLURRIES;

EID: 15344339934     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2004.12.065     Document Type: Conference Paper
Times cited : (7)

References (9)
  • 6
    • 11544373741 scopus 로고    scopus 로고
    • Developing effective inspection systems and strategies for monitoring CMP process
    • February
    • C. Dennison, Developing effective inspection systems and strategies for monitoring CMP process, MICRO Magazine, February 1998, p. 31.
    • (1998) MICRO Magazine , pp. 31
    • Dennison, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.