Laser-induced particulate as carrier of analytical information in LA-ICPMS direct solid microanalysis

Talanta

Volumn 65, Issue 5, 2005, Pages 1286-1294

  Bleiner, Davide ^a   Lienemann, Peter ^a   Vonmont, Heinz ^a  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

Ablation set up; Aerosol; Fractionation; Laser ablation inductively coupled plasma; Signal profile; Wall reaction

Indexed keywords

FRACTIONATION; INDUCTIVELY COUPLED PLASMA; LASER APPLICATIONS; LASER BEAM EFFECTS; MASS SPECTROMETRY; STOICHIOMETRY; VAPORIZATION;

ABLATED PARTICLES; ANALYTE-CARRIERS; PLASMA SPECTROCHEMISTRY; SIGNAL PROFILE DEVIATIONS;

LASER ABLATION;

COBALT; LANTHANUM; MANGANESE; PEROVSKITE; STRONTIUM; YTTRIUM; ZIRCONIUM;

ANALYTIC METHOD; ARTICLE; CERAMICS; CHEMICAL COMPOSITION; LASER; MASS SPECTROMETRY; NANOPARTICLE; PARTICLE SIZE; PARTICULATE MATTER; STOICHIOMETRY; TEMPERATURE SENSITIVITY; VAPORIZATION;

EID: 14844358508     PISSN: 00399140     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.talanta.2004.09.004     Document Type: Article

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