Epitaxial MOD-YSZ buffer layers on IBAD-YSZ substrates

Superconductor Science and Technology

Volumn 18, Issue 3, 2005, Pages 260-263

  Jarzina, H ^a   Sievers, S ^a   Jooss, Ch ^a   Freyhardt, H C ^a   Lobinger, P ^b   Roesky, H W ^b  

^a Institut fur Materialphysik   (Germany)

^b Inst für Anorganische Chemie   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); DEPOSITION; EPITAXIAL GROWTH; FILM GROWTH; ION BEAMS; SINGLE CRYSTALS; SUBSTRATES; SUPERCONDUCTING FILMS; SURFACE STRUCTURE; X RAY DIFFRACTION ANALYSIS;

BUFFER LAYERS; FILM THICKNESS; ION BEAM-ASSISTED DEPOSITION; SURFACE TEXTURE;

SOL-GELS;

EID: 14844320051     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/18/3/009     Document Type: Article

References (11)

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