Reel-to-reel x-ray diffraction and raman microscopy analysis of differentially heat-treated Y-BaF2-Cu precursor films on metre-length RABiTS

Superconductor Science and Technology

Volumn 17, Issue 6, 2004, Pages 739-749

  Venkataraman, K ^a   Lee, D F ^b   Leonard, K ^b   Heatherly, L ^b   Cook, S ^b   Paranthaman, M ^b   Mika, M ^a   Maroni, V A ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CROSSTALK; ELECTRON BEAMS; HEAT TREATMENT; MICROSTRUCTURE; OPTIMIZATION; PHASE COMPOSITION; PRESSURE EFFECTS; QUENCHING; RAMAN SCATTERING; REACTION KINETICS; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

LIQUID PHASE; PRECURSOR FILMS; RAMAN MICROSCOPY; TIME PROCESSING;

YTTRIUM COMPOUNDS;

EID: 3042604706     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/17/6/002     Document Type: Article

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