Growth and characterization of oxide buffer layers for YBCO coated conductors

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 2, 1999, Pages 1527-1530

  Rupich, M W ^a   Palm, W ^a   Zhang, W ^a   Siegal, E ^a   Annavarapu, S ^a   Fritzemeier, L ^b   Teplitsky, M D ^b   Thieme, C ^b   Paranthaman, M ^b  

^a AMERICAN SUPERCONDUCTOR CORPORATION   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CRYSTAL STRUCTURE; FILM GROWTH; LANTHANUM COMPOUNDS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MORPHOLOGY; OXIDE SUPERCONDUCTORS; PHYSICAL PROPERTIES; PRESSURE EFFECTS; SINGLE CRYSTALS; THERMAL EFFECTS; YTTRIUM BARIUM COPPER OXIDES;

COATED CONDUCTORS; CRYSTALLINITY; GRAIN ALIGNMENT; METAL OXIDE FILMS; METAL SUBSTRATES; OXIDE BUFFER LAYERS;

SUPERCONDUCTING FILMS;

EID: 0032655605     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.784684     Document Type: Article

References (10)

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8. M. Paranthaman, S. S. Shoup, D. B. Beach, J. S. Morrell, A. Goyal, E. D. Specht, J. E. Mathis, D. T. Verebelyi, and D. K. Christen, Growth of Textured Buffer Layers and Superconductors on Rolled-Ni Substrates Using Sol-Gel Alkoxide Precursors, Proc. of the 9th World Ceramic Congress and Forum on New Mater. (CIMTEC'98), Florence, Italy, June 14-19, 1998.
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10. Work on deformation textured Ni substrates was carried out willi Oak Ridge National Laboratories under CRADA HTSPC-023.