Surface excitation parameter for semiconducting III-V compounds

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 230, Issue 1-4, 2005, Pages 125-128

  Kwei, C M ^a   Tu, Y H ^a   Tung, C J ^b  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

Dielectric function; Reflection coefficient; Surface excitation parameter

Indexed keywords

APPROXIMATION THEORY; BACKSCATTERING; ELASTICITY; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON TRANSPORT PROPERTIES; FUNCTIONS; INTEGRAL EQUATIONS; MONTE CARLO METHODS; PROBABILITY; REFLECTION; REFRACTIVE INDEX; SEMICONDUCTOR MATERIALS; VACUUM APPLICATIONS;

DIELECTRIC FUNCTIONS; ELASTIC BACKSCATTERING; ELECTRON ENERGY; SURFACE EXCITATION PARAMETERS (SEP);

SURFACE PHENOMENA;

EID: 14744293897     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.12.029     Document Type: Conference Paper

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