Monte Carlo simulation of electron backscattering from compounds with low mean atomic number

Scanning

Volumn 20, Issue 1, 1998, Pages 45-49

  Howell, P G T ^a,b   Boyde, A ^a  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

Computer modelling; Electron backscattering; Monte Carlo simulation; Scanning electron microscopy

Indexed keywords

ARTICLE; CHEMICAL COMPOSITION; COMPUTER MODEL; COMPUTER SIMULATION; ELASTICITY; ELECTRON BEAM; MATERIALS; MOLECULAR INTERACTION; MOLECULAR WEIGHT; PRIORITY JOURNAL; RADIATION SCATTERING; SCANNING ELECTRON MICROSCOPY; SYSTEM ANALYSIS;

EID: 0031813731     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.1998.4950200107     Document Type: Article

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